Institute of Metallurgy > Departments > Microkinetics Group - Prof. H. Schmidt

Solid State Kinetics Group

grain Ofen neutron IBS

Our group is active in the area of materials science with a focus on solid state kinetics. Kinetic processes in solids and at interfaces (metals, ceramics, semiconductors) play a key role for synthesis and optimization of structural and functional materials as well as for the functionality of devices. In this context, atomic transport mechanisms (diffusion), defect equilibria and interface reactions are of high importance for an understanding of fundamental and application relevant properties.

We focus on time-resolved thin film and interface analysis including in-situ characterization of materials and processes. We primarily use neutron and X-ray scattering (NR, GI-XRD, XRR) at large scale facilities in combination with ion beam (SIMS), electrochemical (EIS, CV, GITT), spectroscopic (XPS, FTIR) and electron optical (SEM, TEM) techniques.

Currently, our main topics of research are

Diffusion in Solids
  • In-situ tracer diffusion with neutron reflectometry
  • Diffusion in anodes and cathods for Li-ion batteries
  • Diffusion in oroton-exchanged lithium nionbate for optical wave guides

Kinetics in solids and at interfaces
  • Electrode processes in Li-ion batteries
  • Stress and defects in thin metal films
  • Surface exchange at cerium oxide for syngas production
  • Deposition of thin films by reactive ion-beam sputtering

Research Highlights

E. Hüger, F. Strauß, J. Stahn, J. Deubener, M. Bruns, H. Schmidt, In-situ Measurement of Self-Atom Diffusion in Solids Using Amorphous Germanium as a Model System, Scientific Reports 8 (2018), 17607, Link

F. Strauß, L. Dörrer, T. Geue, J. Stahn, A. Koutsioubas, S. Mattauch, H. Schmidt, Self-diffusion in amorphous silicon, Phys. Rev. Lett. 116 (2016),025901, Link

B. Jerliu, L. Dörrer, E. Hüger, B.-K. Seidlhofer, R. Steitz, U. Geckle, V. Oberst, M. Bruns, H. Schmidt, Volume Expansion during Lithiation of Amorphous Silicon Thin Film Electrodes Studied by In-Operando Neutron Reflectometry, J. Phys. Chem. C 118 (2014), 9395, Link

E. Hüger, L. Dörrer, J. Rahn, T. Panzner, J. Stahn, G. Lilienkamp, H. Schmidt, Lithium Transport through Nanosized Amorphous Silicon Layers, Nano Lett. 13 (2013), 1237, Link

E. Hüger, J. Rahn, J. Stahn, T. Geue, H. Schmidt, Diffusivity determination in bulk materials on nanometric length scales, Phys. Rev. B 85 (2012), 214102, Link

W. Gruber, S. Chakravarty, C. Baehtz, W. Leitenberger, M. Bruns, A. Kobler, C. Kübel, H. Schmidt, Strain relaxation and vacancy creation in thin platinum films, Phys. Rev. Lett. 107 (2011), 265501, Link

H. Schmidt, M. Gupta, M. Bruns, Nitrogen diffusion in amorphous silicon nitride isotope multilayers proped by neutron reflectometry, Phys. Rev. Lett.96 (2006), 055901, Link

molife CZM

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